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Advances in Imaging and Electron Physics
| Subject Area | Rank | Percentile |
|---|---|---|
| Category: Engineering Subcategory: Electrical and Electronic Engineering |
920 / 1030 | |
| Category: Engineering Subcategory: Nuclear and High Energy Physics |
88 / 97 | |
| Category: Engineering Subcategory: Condensed Matter Physics |
435 / 446 |
| APC | APC Waiver | Other Charges |
|---|---|---|
| N/A | N/A | N/A |
| Journal Title | h-index | CiteScore |
|---|---|---|
| APPLIED PHYSICS LETTERS | 401 | 5.80 |
| JOURNAL OF PHYSICS D-APPLIED PHYSICS | 172 | 5.90 |
| METROLOGIA | 67 | 3.20 |
| JOURNAL OF APPLIED PHYSICS | 294 | 4.40 |
| Applied Physics Express | 79 | 5.20 |
| JAPANESE JOURNAL OF APPLIED PHYSICS | 116 | 3.10 |
| REVIEW OF SCIENTIFIC INSTRUMENTS | 145 | 3.00 |
| PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 79 | 2.30 |
| MAPAN-Journal of Metrology Society of India | 13 | 3.20 |
| EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 44 | 2.20 |
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