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[MICROELECTRONICS INTERNATIONAL]Hello, you are Visitor Number 14365 on this page.

Journal Profile
Journal TitleMICROELECTRONICS INTERNATIONAL
Journal Title AbbreviationsMICROELECTRON INT
ISSN1356-5362
h-index19
CiteScore
CiteScoreSJRSNIPCiteScore Rank
1.900.1880.354
Subject fieldQuartilesRankPercentile
Category: Engineering
Subcategory: Electrical and Electronic Engineering
Q3511 / 797
Category: Engineering
Subcategory: Surfaces, Coatings and Films
Q390 / 132
Category: Engineering
Subcategory: Electronic, Optical and Magnetic Materials
Q3201 / 284
Category: Engineering
Subcategory: Condensed Matter Physics
Q3308 / 434
Category: Engineering
Subcategory: Atomic and Molecular Physics, and Optics
Q3163 / 224

Self-Citation Ratio (2020-2021)6.30%
期刊简介Lorem ipsum dolor sit amet, consectetur adipiscing elit. Sed do eiusmod tempor incididunt ut labore et dolore magna aliqua. Ut enim ad minim veniam, quis nostrud exercitation ullamco laboris nisi ut aliquip ex ea commodo consequat. Duis aute irure dolor in reprehenderit in voluptate velit esse cillum dolore eu fugiat nulla pariatur. Excepteur sint occaecat cupidatat non proident, sunt in culpa qui officia deserunt mollit anim id est laborum.
Official Websitehttps://www.emerald.com/insight/publication/issn/1356-5362
Online Manuscript Submissionhttps://mc.manuscriptcentral.com/miij
Open AccessYes (Hybrid OA journal)
PublisherEMERALD GROUP PUBLISHING LIMITED, HOWARD HOUSE, WAGON LANE, BINGLEY, ENGLAND, W YORKSHIRE, BD16 1WA
Subject AreaEngineering
Country/Area of PublicationENGLAND
Publication FrequencyTri-annual
Year Publication Started1982
Annual Article Volume30
Gold OA文章占比
OA期刊相关信息
WOS期刊SCI分区
Indexing (SCI or SCIE)Science Citation Index Expanded
Link to PubMed Central (PMC)https://www.ncbi.nlm.nih.gov/nlmcatalog?term=1356-5362%5BISSN%5D
Average Duration of Peer Review *Authorized Data from Publisher:
Data from Authors: >12 Week(s), or Invited contributions
Competitiveness *Data from Authors: Easy
Useful Links
Relevant Journals 【MICROELECTRONICS INTERNATIONAL】CiteScore Trend
Comments from Authors
*All review process metrics, such as acceptance rate and review speed, are limited to our user-submitted manuscripts. As such they may not reflect the journals' exact competitiveness or speed.
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Reviewed 2011-08-20 13:35:00
Journal Homepage URL: http://www.emeraldinsight.com/Journals.htm?issn=1356-5362
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