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MICROELECTRONICS JOURNAL


👁  74680 View(s)

 30 Review(s)  

 Open Access      SCIE      Official Website     Submission Website
 

*Average Peer Review
About 3.0 month(s)
*Competitiveness
Easy
CiteScore
4.2

CiteScore Rank
Subject Area Rank Percentile
Category: Engineering
Subcategory: Electrical and Electronic Engineering
379 / 1030
Category: Engineering
Subcategory: Condensed Matter Physics
195 / 446
Category: Engineering
Subcategory: Atomic and Molecular Physics, and Optics
108 / 243
Category: Engineering
Subcategory: Surfaces, Coatings and Films
64 / 141
Category: Engineering
Subcategory: Electronic, Optical and Magnetic Materials
154 / 318



Country/Area of Publication
ENGLAND
Publication Frequency
Monthly
Publisher
Elsevier

ISSN
0026-2692
E-ISSN
1879-2391
Year Publication Started
0

Self-citation (2025-2026)
27.30%
Annual Article Volume
386
Gold OA Percentage
5.14%


Open Access Info
APC APC Waiver Other Charges
N/A N/A N/A

Journal Aim & Scope
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.

The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.

Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.


Web of Science Quartiles
WOS Quartile: Q3

Quartiles By JIFCollectionQuartileRankPercentage
Category: ENGINEERING, ELECTRICAL & ELECTRONICSCIEQ3229/369
Category: NANOSCIENCE & NANOTECHNOLOGYSCIEQ4120/148
Quartiles By JCICollectionQuartileRankPercentage
Category: ENGINEERING, ELECTRICAL & ELECTRONICSCIEQ3250/371
Category: NANOSCIENCE & NANOTECHNOLOGYSCIEQ3104/148
*Crowdsourced data
  • Journals In The Same Subject Area
  • CiteScore Trends
  • Self Citation Trends
  • Annual Article Volume Trends
  • Journal Title h-index CiteScore
    PROCEEDINGS OF THE IEEE25060.30
    IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE32641.10
    IEEE TRANSACTIONS ON IMAGE PROCESSING24221.70
    IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING14822.70
    IEEE SIGNAL PROCESSING MAGAZINE15520.80
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY15418.10
    PROGRESS IN QUANTUM ELECTRONICS5819.70
    IEEE TRANSACTIONS ON FUZZY SYSTEMS17020.50
    EXPERT SYSTEMS WITH APPLICATIONS16217.00
    IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS11220.50
  • MICROELECTRONICS JOURNAL MICROELECTRONICS JOURNAL
    Predict CiteScore Trend:
    Steady Increase No Change Gradual Decline  Refresh
 
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