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EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
| Subject Area | Rank | Percentile |
|---|---|---|
| Category: Physics and Astronomy Subcategory: Instrumentation |
113 / 174 | |
| Category: Physics and Astronomy Subcategory: Electronic, Optical and Magnetic Materials |
218 / 305 | |
| Category: Physics and Astronomy Subcategory: Condensed Matter Physics |
333 / 443 |
| APC | APC Waiver | Other Charges |
|---|---|---|
| N/A | N/A | N/A |
| Quartiles By JIF | Collection | Quartile | Rank | Percentage |
| Category: PHYSICS, APPLIED | SCIE | Q4 | 165/187 |
|
| Quartiles By JCI | Collection | Quartile | Rank | Percentage |
| Category: PHYSICS, APPLIED | SCIE | Q4 | 166/187 |
|
| Journal Title | h-index | CiteScore |
|---|---|---|
| APPLIED PHYSICS LETTERS | 401 | 6.10 |
| JOURNAL OF PHYSICS D-APPLIED PHYSICS | 172 | 6.40 |
| JOURNAL OF APPLIED PHYSICS | 294 | 5.10 |
| METROLOGIA | 67 | 3.00 |
| Applied Physics Express | 79 | 4.70 |
| JAPANESE JOURNAL OF APPLIED PHYSICS | 116 | 2.90 |
| REVIEW OF SCIENTIFIC INSTRUMENTS | 145 | 2.90 |
| MAPAN-Journal of Metrology Society of India | 13 | 2.70 |
| PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 79 | 2.40 |
| TECHNICAL PHYSICS LETTERS | 29 | 1.10 |
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